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testing of materials造句

"testing of materials"是什么意思   

例句与造句

  1. The particular advantage of the compliance measurement method is that the loading fixtures used can be identical to those needed for fracture tests or crack-propagation tests of materials .
    柔度测量法的特殊优点是可以使用材料断裂试验或裂纹扩展所用的加载夹具。
  2. Test methods for bend testing of materials for ductility
    展延性材料弯曲试验方法
  3. Testing of materials ; burning behaviour of materials ; burner
    材料试验.材料的燃烧性能.燃烧器
  4. Strength of materials and mechanical tests of materials . vocabulary
    材料的强度和机械性能试验.词汇
  5. Standard test methods for bend testing of material for ductility
    材料延展性的弯曲测试的标准试验方法
  6. It's difficult to find testing of materials in a sentence. 用testing of materials造句挺难的
  7. Testing of materials ; burning behaviour of materials ; small burning cabinet
    材料检验.材料的燃烧性能.小燃烧箱
  8. Test methods for conducting time for rupture notch tension tests of materials
    材料断裂缺口拉伸试验执行时间测试方法
  9. Standard test methods for conducting time - for - rupture notch tension tests of materials
    材料断裂时间的凹口张力试验的标准试验方法
  10. Testing of materials ; continuous vibration test ; definitions , symbols , procedure , evaluation
    材料检验.连续振动试验.定义符号程序评价
  11. Testing of materials for radiation protection against x - rays and gamma - rays ; x - rays up to 400 kv
    对射线和射线的防护材料的检验. 400kv以下射线
  12. Testing of materials , structural components and equipment ; method of test in damp alternating atmosphere
    材料结构件及设备的试验.潮湿变化气候下的试验方法
  13. Standard guide for documenting the results of chemical permeation testing of materials used in protective clothing
    防护服装材料化学试剂渗透性检验结果的报告编制
  14. Testing of materials , structural components and equipment ; hot cabinets ; directions for the storage of specimens
    材料结构元件和设备的检验.加热箱.试样贮存指导说
  15. Testing of materials for semiconductor technology ; determination of impurty content in silicon by infrared absorption ; carbon
    半导体工艺材料的检验.第2部分:用红外线吸收法测量硅
  16. Testing of materials for semiconductor technology - determination of defect types and defect densities of silicon epitaxial layers
    半导体工艺材料的检验.硅晶体外延层缺陷种类和缺陷密
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Last modified time:Fri, 15 Aug 2025 00:29:56 GMT